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X28HC256
Endurance and Data Retention
PARAMETER
Endurance
Data retention
AC Conditions of Test
Input pulse levels
0V to 3V
MIN
1,000,000
100
Symbol Table
MAX
UNIT
Cycles
Years
Input rise and fall times
Input and output timing levels
5ns
1.5V
WAVEFORM
INPUTS
Must be
steady
OUTPUTS
Will be
steady
Mode Selection
CE OE WE
MODE
I/O
POWER
May change
from LOW
to HIGH
Will change
from LOW
to HIGH
L
L
H
X
X
L
H
X
L
X
H
L
X
X
H
Read
Write
Standby and write
inhibit
Write inhibit
Write inhibit
D OUT
D IN
High Z
—
—
active
active
standby
—
—
May change
from HIGH
to LOW
Don’t Care:
Changes
Allowed
N/A
Will change
from HIGH
to LOW
Changing:
State Not
Known
Center Line
is High
Impedance
Equivalent AC Load Circuit
5V
1.92k Ω
OUTPUT
1.37k Ω
AC Electrical Specifications
30pF
Over Recommended Operating Conditions, Unless Otherwise Specified.
X28HC256-70
X28HC256-90
X28HC256-12
X28HC256-15
PARAMETER
SYMBOL
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
UNIT
Read Cycle Time
Chip Enable Access Time
Address Access Time
Output Enable Access Time
CE LOW to Active Output
OE LOW to Active Output
CE HIGH to High Z Output
OE HIGH to High Z Output
Output Hold from Address Change
t RC (Note 5)
t CE (Note 5)
t AA (Note 5)
t OE
t LZ (Note 4)
t OLZ (Note 4)
t HZ (Note 4)
t OHZ (Note 4)
t OH
70
0
0
0
70
70
35
35
35
90
0
0
0
90
90
40
40
40
120
0
0
0
120
120
50
50
50
150
0
0
0
150
150
50
50
50
ns
ns
ns
ns
ns
ns
ns
ns
ns
10
FN8108.3
September 21, 2011
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